YADAV, Balkrishna Rasiklal. AI and ML-Enhanced Nano Positioning for Large-Scale XY Scanning Applications. Innovative Multidisciplinary Journal of Applied Technology, [S. l.], v. 1, n. 1, p. 106–111, 2023. Disponível em: https://www.multijournals.org/index.php/innovative/article/view/2182. Acesso em: 23 oct. 2026.